Published July 31, 2020 | Version v1
Journal article Metadata-only

Charged domains in ferroelectric, polycrystalline yttrium manganite thin films resolved with scanning electron microscopy

Creators

  • 1. Department Back-End of Line, Fraunhofer Institute for Electronic Nano Systems, 09126 Chemnitz (Germany)
  • 2. Center for Microtechnologies, Chemnitz University of Technology, 09126 Chemnitz (Germany)
  • 3. Leibniz Institute of Photonic Technology e.V., 07745 Jena (Germany)
  • 4. Institute of Experimental Physics, TU Bergakademie Freiberg, 09596 Freiberg (Germany)
  • 5. Institute for Solid State Physics, University of Jena, 07743 Jena (Germany)
  • 6. Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf e.V., 01328 Dresden (Germany)

Description

We have investigated ferroelectric charged domains in polycrystalline hexagonal yttrium manganite thin films (Y1Mn1O3, Y0.95Mn1.05O3, Y1Mn0.99Ti0.01O3, and Y0.94Mn1.05Ti0.01O3) by scanning electron microscopy (SEM) in secondary electron emission mode with a small acceleration voltage. Using SEM at an acceleration voltage of 1.0 kV otherwise homogenous surface charging effects are reduced, polarization charges can be observed and polarization directions (±Pz) of the ferroelectric domains in the polycrystalline thin films can be identified. Thin films of different chemical composition have been deposited by pulsed laser deposition on Pt/SiO2/Si structures under otherwise same growth conditions. Using SEM it has been shown that different charged domain density networks are existing in polycrystalline yttrium manganite thin films. (letter)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6528/ab8b09

Additional details

Identifiers

DOI
10.1088/1361-6528/ab8b09;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
31
Journal Issue
31
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54057184
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ACCELERATION; CHEMICAL COMPOSITION; DENSITY; DEPOSITS; ELECTRIC POTENTIAL; ELECTRON EMISSION; ENERGY BEAM DEPOSITION; FERROELECTRIC MATERIALS; LASER RADIATION; POLARIZATION; POLYCRYSTALS; PULSED IRRADIATION; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON OXIDES; SURFACES; THIN FILMS; YTTRIUM
Descriptors DEC
CHALCOGENIDES; CRYSTALS; DEPOSITION; DIELECTRIC MATERIALS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; FILMS; IRRADIATION; MATERIALS; METALS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SILICON COMPOUNDS; SURFACE COATING; TRANSITION ELEMENTS