Quantification of Multilayer Samples by Confocal μXRF
- 1. CEPROCOR, Ministerio de Ciencia y Tecnologia de Cordoba, Santa Maria de Punilla (5164), Cordoba (Argentina)
- 2. CONICET, Rivadavia 1917, Buenos Aires (1033) (Argentina)
- 3. Facultad de Matematica Astronomia y Fisica, Universidad Nacional de Cordoba, Ciudad Universitaria, Cordoba (5000) (Argentina)
- 4. Laboratorio Nacional de Luz Sincrotron-LNLS, POB6192, 13084-97 Campinas, SP (Brazil)
Description
The confocal setup consists of x-ray lenses in the excitation as well as in the detection channel. In this configuration, a micro volume defined by the overlap of the foci of both x-ray lenses is analyzed. Scanning this micro volume through the sample, 1-3 dimensional studies can be performed. For intermediate thin homogeneous layers a scanning in the normal direction to the surface sample provides information of its thickness and elemental composition. For multilayer samples it also provides the order of each layer in the stratified structure. For the confocal setup, we used a glass monocapillary in the excitation channel and a monolithic half polycapillary in the detection channel. The experiment was carried out at the D09B beamline of the LNLS using white beam. In the present work, a new algorithm was applied to analyze in detail by confocal μXRF a sample of three paint layers on a glass substrate. Using the proposed algorithm, information about thickness and elemental densities was obtained for each layer of these samples.
Additional details
Identifiers
- DOI
- 10.1063/1.3086201;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1092
- Journal Issue
- 1
- Journal Page Range
- p. 107-111
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on synchrotron radiation in materials science
- Dates
- 20-23 Jul 2008
- Place
- Campinas (Brazil)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41011054
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; EXCITATION; GLASS; LAYERS; LENSES; SUBSTRATES; SYNCHROTRON RADIATION; THICKNESS; THREE-DIMENSIONAL CALCULATIONS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY LASERS
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ENERGY-LEVEL TRANSITIONS; IONIZING RADIATIONS; LASERS; MATHEMATICAL LOGIC; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; RADIATIONS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2009 American Institute of Physics