Effect of film thickness on properties of electrodeposited Ni-Co films
Creators
- 1. Physics Department, Science and Literature Faculty, Balikesir University, Balikesir (Turkey)
- 2. Physics Department, Science and Literature Faculty, Uludag University, Bursa (Turkey)
Description
A series of Ni-Co films with different thicknesses was produced by using the electrodeposition technique and their microstructural, magnetic and magnetotransport properties were investigated. The X-ray (XRD) diffraction measurements showed that the films have the face centered cubic structure and the preferential orientations of the films were in the order of (1 1 1), (2 2 0) and (2 2 0) for the films with 1, 2 and 4 μm thicknesses, respectively. The magnetic measurements revealed that the coercivity decreased from 52 Oe to 37 Oe due to the regular transition of preferential orientation from (1 1 1) to (2 2 0) with increasing film thickness. The study demonstrated that magnetic properties of the films changed according to the microstructural properties. Magnetoresistance investigations exhibited that all films have anisotropic magnetoresistance (AMR).
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2012.01.083Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2012.01.083;
- PII
- S0169-4332(12)00113-4;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 12
- Journal Page Range
- p. 5046-5051
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44030591
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; COBALT ALLOYS; COERCIVE FORCE; ELECTROCHEMISTRY; ELECTRODEPOSITION; FCC LATTICES; MAGNETIC PROPERTIES; MAGNETORESISTANCE; METALS; MICROSTRUCTURE; NICKEL ALLOYS; SYNTHESIS; THICKNESS; THIN FILMS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CHEMISTRY; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROLYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IONIZING RADIATIONS; LYSIS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SURFACE COATING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.