Published 2017
| Version v1
Journal article
Laboratory study of modified pixel implantations
Creators
- 1. TU Dortmund, Experimentelle Physik IV (Germany)
- 2. CERN (Switzerland)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Laboruntersuchung modifizierter Pixelimplantationen
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Muenster 2017 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 52(4)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 81. Annual meeting of DPG and DPG Spring meeting 2017 of the divisions on hadronic and nuclear physics, radiation and medical physics, particle physics and the working groups on equal opportunities, energy, information, young DPG, physics and disarmament
- Original Conference Title
- 81. Jahrestagung der DPG und DPG-Fruehjahrstagung 2017 der Fachverbaende Physik der Hadronen und Kerne, Strahlen- und Medizinphysik, Teilchenphysik und Arbeitskreise Chancengleichheit, Energie, Industrie und Wirtschaft sowie der Arbeitsgruppen Information, junge DPG, Physik und Abruestung
- Dates
- 27-31 Mar 2017
- Place
- Muenster (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 50000575
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BETA DETECTION; CHARGE COLLECTION; DESIGN; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; INTEGRATED CIRCUITS; KEV RANGE 100-1000; PHYSICAL RADIATION EFFECTS; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; ENERGY RANGE; KEV RANGE; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- Session: T 69.5 Di 17:45