Published June 1991
| Version v1
Journal article
Core-level and valence-band X-ray photoelectron diffraction in UO2(100)
Description
X-ray photoelectron diffraction (XPD) effects have been studied in the U 4f, O 1s and valence-band spectra of UO2(100). A simple nearest-neighbor forward-scattering model adequately explains the intensity modulations which occur with changes in polar angle, θ. In the valence band, the U 5f and U 6p3/2 peaks and the O 2p band show very similar angular intensity variations showing that the O 2p band's intensity is largely U-orbital derived. (author)
Additional details
Publishing Information
- Journal Title
- Solid State Communications
- Journal Volume
- 78
- Journal Issue
- 12
- Series
- Solid State Commun.
- Journal Page Range
- 1033-1037
- ISSN
- 0038-1098
- CODEN
- SSCOA
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 22078329
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BINDING ENERGY; ELECTRONIC STRUCTURE; F STATES; PHOTOELECTRON SPECTROSCOPY; URANIUM DIOXIDE; VALENCE; X-RAY DIFFRACTION
- Descriptors DEC
- ACTINIDE COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ENERGY; ENERGY LEVELS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SPECTROSCOPY; URANIUM COMPOUNDS; URANIUM OXIDES