Published May 1, 2016 | Version v1
Journal article

Synthesis, characterization, and transport properties of single-layer pure and molybdenum-doped vanadium oxide thin films on metallic conductive substrates

Description

Single-layer undoped and 10 mol% molybdenum (Mo)-doped vanadium oxide (V2O3) thin films with thicknesses of approximately 342 nm are fabricated by an aqueous sol–gel method and then deposited onto 316L stainless steel conductive substrates. The influence of various annealing temperatures (in a nitrogen atmosphere) on the structural and electrical properties of undoped and Mo-doped vanadium oxide thin films is investigated. Through a controlled annealing process, the electrical resistances of the single-layer thin films are optimized to attain the required amount of Joule heating for cold-start fuel cell applications within an ambient temperature range (273.15 to 253.15 K). The films show a negative temperature coefficient (NTC) behavior and a transition from a metal to an insulator at sub-zero temperatures. The highest electrical resistivities are measured to be 0.032 Ω·cm and 0.071 Ω·cm for undoped and Mo-doped vanadium oxide films, respectively, after annealing under 20 sccm N2 at 673.15 K. Consequently, the equilibrium surface temperature of the single-layer Mo-doped vanadium oxide thin film increases from 253.15 K to 299.46 K upon induced Joule heating at a current density of 0.1 A·cm−2. Thus, it is concluded that single-layer NTC Mo-doped vanadium oxides can be effectively used for cold-start fuel cell applications. - Highlights: • Single-layer undoped and 10 mol% Mo-doped vanadium oxide films were fabricated. • Mo-doped V2O3 thin films showed am enhanced NTC behavior through annealing. • Mo-doped V2O3 thin films revealed the high resistivity of 0.071 Ω·cm at 253.15 K. • Remarkable temperature rise of a Mo-doped V2O3 film was achieved by Joule heating. • Mo-doped V2O3 films can be effectively used for cold-start fuel cell applications.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2016.03.036

Additional details

Identifiers

DOI
10.1016/j.tsf.2016.03.036;
PII
S0040-6090(16)00220-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
606
Journal Page Range
p. 63-73
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.