Near-field detection at microwave frequencies based on self-adjoint response sensitivity analysis
Creators
- 1. Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, L8S 4K1 (Canada)
Description
A new detection method is proposed for the localization of electrically small scatterers in a known background medium. The method requires the knowledge of the electric field distribution inside the known background medium where no scatterers are present. It is based on a self-adjoint response sensitivity computation which can be performed in real time. Using the E-field distribution in the background medium, it provides three-dimensional maps of the Fréchet derivative within the imaged volume. The peaks and dips in these maps identify the locations where the permittivity and conductivity of the measured medium differ from those in the background medium. The background medium can be heterogeneous. In a homogeneous-medium example, the performance of the detection algorithm is studied in terms of the number of transmission/reception points, the dielectric contrast of the scatterer compared to the background medium, and the size of the scatterer. Its resolution is also addressed. The detection of a small scatterer in a heterogeneous background is demonstrated
Availability note (English)
Available from http://dx.doi.org/10.1088/0266-5611/26/10/105001Additional details
Identifiers
- DOI
- 10.1088/0266-5611/26/10/105001;
- PII
- S0266-5611(10)48294-5;
Publishing Information
- Journal Title
- Inverse Problems
- Journal Volume
- 26
- Journal Issue
- 10
- Journal Page Range
- [28 p.]
- ISSN
- 0266-5611
- CODEN
- INVPET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45034634
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALGORITHMS; CALCULATION METHODS; COMPARATIVE EVALUATIONS; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; IMAGES; MEASURING METHODS; MICROWAVE RADIATION; PERMITTIVITY; SENSITIVITY ANALYSIS; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; EVALUATION; MATERIALS; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; RADIATIONS