Published December 15, 2004 | Version v1
Journal article

Controlled growth of O-polar ZnO epitaxial film by oxygen radical preconditioning of sapphire substrate

  • 1. Beijing Laboratory of Electron Microscopy, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080, China and Beijing University of Technology, Beijing 100022 (China)
  • 2. Beijing National Laboratory of Electron Microscopy for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080 (China)

Description

Oxygen radicals pregrowth treatment and surface nitridation were used to eliminate Zn-polar inversion domains and control the growth of single-domain O-polar ZnO film on sapphire (0001) substrate by rf plasma-assisted molecular beam epitaxy. We found that the formation of oxygen-terminated sapphire surface prior to nitridation is crucial for achieving the anion polarity in subsequent AlN and ZnO layers, as demonstrated by formation of the 3x3 surface reconstruction during ZnO growth and ex situ polarity determination. This method, in general, can be applied to growth of other polar films, such as II-VI oxides and III-V nitrides, on sapphire (0001) substrates.(c)

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
96
Journal Issue
12
Journal Page Range
p. 7108-7111
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2004 American Institute of Physics