Xe bubbles formation in materials for use in nuclear reactors studied by slow positrons

Materials (UO₂ and ZrC) for use in nuclear reactors implanted with 800-keV Xe-ions were studied by means of slow positron beam (SPB) spectroscopy. Doppler broadening of annihilation gamma-line technique was used to measure the momentum density distribution (MDD) of annihilating positron electron pairs in two sets of samples implanted at fluences of 1×1016 Xe cm−2. The sensitivity of the MDD shape parameter S to discriminate single Xe atoms and Xe bubbles was discussed. Common trends in Xe bubbles formation as a result of the Xe fluence and/or post-implantation annealing in both materials were described. Positron spectroscopy on SPB was demonstrated to be an excellent complementary technique to secondary ion mass spectroscopy for studying the formation and evolution of Xe-bubbles, and Xe retention. PACS codes: 28.90.+i