Published March 28, 2014 | Version v1
Journal article

Metrological characterization of optical confocal sensors measurements (20 and 350 travel ranges)

  • 1. Laboratoire Commun de Métrologie (LNE-CNAM), Laboratoire National de Métrologie et d'Essais (LNE), 1 Rue Gaston Boissier, 75015 Paris (France)
  • 2. Ecole Normale Supérieure de Cachan, The University Research Laboratory in Automated Production, 61 avenue du Président Wilson, 94235 Cachan (France)

Description

Confocal sensors are usually used in dimensional metrology applications, like roughness, form, thickness and surface profile measurements. With the progress of technologies, metrological applications require measurements with nanometer-level of accuracy by using ultra-high precision machines, which should present a minimum and stable metrology loop. The loop is equipped with sensors with nanometer-level of resolution and linear residual. The study presented here, is mainly focused on the characterization of Confocal sensors in order to identify their performance practically. Such information is useful to establish a correction model in the digital signal processing (DSP) software. In this context, LNE developed an ultra-high-precision machine, dedicated to the roughness measurement with an uncertainty of a few nanometres (< 30 nm) by using a tactile sensor. In order to match this machine to Confocal sensors, an experiment has been recently developed to characterize the behaviour of two commercial Confocal sensors with the measuring range of 20 μm and 350 μ m. The experiment permits the evaluation of the major error sources: axial and radial motion errors as-well-as the deviation/tilt of the sensors

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/483/1/012015

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
483
Journal Issue
1
Journal Page Range
[12 p.]
ISSN
1742-6596

Conference

Title
14. international conference on metrology and properties of engineering surfaces
Dates
17-21 Jun 2013
Place
Taipei, Taiwan (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46073556
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; COMPUTER CODES; CORRECTIONS; ERRORS; EVALUATION; PERFORMANCE; PROCESSING; RESOLUTION; ROUGHNESS; SENSORS; SURFACES; THICKNESS
Descriptors DEC
DIMENSIONS; SURFACE PROPERTIES