Characterization of an indirect X-ray imaging detector by simulation and experiment

We describe a comprehensive model of a commercial indirect X-ray imaging detector that accurately predicts the detector point spread function and its dependence on X-ray energy. The model was validated by measurements using monochromatic synchrotron radiation and extended to polychromatic X-ray sources. Our approach can be used to predict the performance of an imaging detector and can be used to optimize imaging experiments with broad-band X-ray sources. - Highlights: • We modeled the point spread function of an indirect X-ray imaging detector. • The effects of optical coupling between detector components were included. • The model was validated with monochromatic and polychromatic X-ray source. • The geometrical arrangement for optimal detector resolution was identified