Published January 23, 2009
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Response Time Measurements of the NIF DANTE XRD-31 X-Ray Diodes (Pre-print)
Description
The XRD-31 is a fast, windowless X-ray vacuum photodiode developed by EG and G. It is currently the primary fast X-ray detector used to diagnose the X-rays on NIF and OMEGA on the multichannel DANTE spectrometer. The XRD-31 has a dynamic range of less than 1e-12 amps to more than 10 amps. A technique is described to measure the impulse response of the diodes to a 150 fs pulse of 200 nm laser light and a method to calculate the 'risetime' for a square pulse and compare it with the computed electron transit time from the photocathode to the anode. Measured response time for 5 XRD-31s assembled in early 2004 was 149.7 ps +-2.75 ps
Availability note (English)
Available from INIS in electronic form; Also available from OSTI as DE00946435; PURL: https://www.osti.gov/servlets/purl/946435-dUAyn8/
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Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- DOE/NV--25946-086
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 40028874
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRONS; LASERS; PHOTOCATHODES; PHOTODIODES; TIME MEASUREMENT
- Descriptors DEC
- CATHODES; ELECTRODES; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES
Optional Information
- Contract/Grant/Project number
- AC52-06NA25946
- Funding organization
- USDOE National Nuclear Security Administration (United States)