Published March 5, 2014 | Version v1
Journal article

Measuring conditions for second order X-ray Bragg-spectrometry

  • 1. Institute of Photonic Technology, Albert-Einstein-Strasse 9, DE-07745 Jena (Germany)

Description

The KL2,3 (α)1,2-lines of 19K, the L3M4,5 (α)1,2-lines of 48Cd, and the M5N6,7 (α)1,2-lines of 92U are lines of comparable energy in the region of approximately 3 keV. In none of these cases were we able to resolve the three doublets when recording the spectra in first order Bragg spectrometry using a PET crystal as the dispersing element. For the purpose of enhancing the resolving power of the spectrometer, the three α spectra were recorded in second order reflection, thereby transferring the lines into another spectral region dominated by X-ray quanta of half the energy. In order to achieve high net peak intensities as well as a high peak-to-background ratio and, consequently, a high level of detection capability, the discriminator settings should be optimized quite carefully. In this manner, we were able to resolve the three α doublets and estimate α21 intensity ratios. Inexplicably, current monographs, e.g., by Goldstein et al, do not contain any indications about the rational use of high order spectrometry. Only a few rather old monographs contain some hints in this regard

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/55/1/012003

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
55
Journal Issue
1
Journal Page Range
[11 p.]
ISSN
1757-899X

Conference

Title
13. European workshop on modern developments and applications in microbeam analysis
Acronym
EMAS 2013 workshop
Dates
12-16 May 2013
Place
Porto (Portugal)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47067466
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; CRYSTALS; DETECTION; KEV RANGE; PEAKS; POSITRON COMPUTED TOMOGRAPHY; SPECTRA; SPECTROSCOPY; X RADIATION
Descriptors DEC
COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; EMISSION COMPUTED TOMOGRAPHY; ENERGY RANGE; EVALUATION; IONIZING RADIATIONS; RADIATIONS; TOMOGRAPHY