Published June 15, 2008 | Version v1
Journal article

Laser micro-machining using near-field optics

  • 1. Department of Mechanical and System Design Engineering, Hongik University, 71-1 Sangsu-Dong, Mapo-gu, Seoul 121-791 (Korea, Republic of)
  • 2. Department of Mechanical Engineering, University of Michigan, Ann Arbor, MI 48109-2125 (United States)
  • 3. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0405 (United States)

Description

Solid immersion lenses (SIL) facilitate high numerical aperture (NA) and consequent sub-wavelength diffraction limited focusing in near-field optics based systems. Such systems are in commercial and research use for various applications including near-field scanning optical microscopy, ultra-high-density magneto-optic data storage and near-field nanolithography. Here, we present a novel manufacturing method using SIL-based near-field optics for laser-induced patterning on silicon wafers. The near-field effect of SILs was investigated by using hemispherical lenses made of three different materials (BK7, Sapphire, LaSFN9) to superfocus an incident Q-switched, 532 nm Nd:YAG laser beam transmitted through a focusing objective. This optical arrangement achieved a laser-processed feature resolution near the diffraction limit in air. Results of experiments that were conducted at various processing conditions to investigate the effects of varying incident laser power (with peak pulse power less than 1 W), pulse width, number of pulses and size of SIL on processed feature size and resolution are presented. Experimental results are compared with numerical simulations using the simplified model

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.02.004

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.02.004;
PII
S0169-4332(08)00255-9;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
16
Journal Page Range
p. 5105-5110
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40030095
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
APERTURES; DIFFRACTION; LENSES; NEODYMIUM LASERS; OPTICS; SAPPHIRE; SCANNING LIGHT MICROSCOPY
Descriptors DEC
COHERENT SCATTERING; CORUNDUM; LASERS; MICROSCOPY; MINERALS; OPENINGS; OPTICAL MICROSCOPY; OXIDE MINERALS; SCATTERING; SOLID STATE LASERS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.