Published October 2006 | Version v1
Journal article

Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope

  • 1. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628CJ Delft (Netherlands)
  • 2. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628CJ Delft (Netherlands) and Brockhouse Institute for Materials Research, McMaster University, Hamilton, L8S 4M1 (Canada)

Description

The significant enhancement of the energy resolution in the new generation of commercially available monochromated transmission electron microscopes presents new challenges in term of selecting the correct experimental conditions and understanding the various effects that can potentially influence the quality of the EELS data. In this respect we investigated the effect of point spread function of the detector and spectrum-diffraction mixing on the energy resolution and the intensity of the zero loss peak tails. Alternative approaches to improve the energy resolution by mathematical methods have been tested. By using a simple and commonly available test case (Si L2,3 edges) we assessed the efficiency of the deconvolution algorithms to improve the resolution. The results show that the deconvolution is not always successful in improving the resolution of the core loss EELS data and the results may not always be reliable. Contrary to this, the application of the Richardson-Lucy deconvolution algorithm on some bandgap measurements data appears to be very effective. The procedure proved successful in removing the contribution of the zero-loss peak tails and allows an easier access to spectroscopic information starting at energy losses as low as of 0.5 eV with monochromated spectra and 1 eV with the non-monochromated spectra

Additional details

Identifiers

DOI
10.1016/j.ultramic.2006.04.024;
PII
S0304-3991(06)00110-0;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
106
Journal Issue
11-12
Journal Page Range
p. 1091-1103
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
International workshop on enhanced data generated by electrons
Dates
1-5 May 2005
Place
Grundlsee (Austria)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38022990
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; DIFFRACTION; ELECTRONS; ENERGY LOSSES; ENERGY RESOLUTION; EV RANGE; MICROSCOPES; SPECTRA; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
COHERENT SCATTERING; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; LEPTONS; LOSSES; MATHEMATICAL LOGIC; MICROSCOPY; RESOLUTION; SCATTERING

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.