Published April 2013 | Version v1
Journal article

Temperature-dependent resistive switching behavior in the structure of Au/Nb:SrTiO3/Ti

  • 1. Zhejiang Sci-Tech University, Department of Physics, Center for Optoelectronics Materials and Devices, Hangzhou (China)
  • 2. Zhejiang Sci-Tech University, Nanometer Measurement Lab, Hangzhou (China)
  • 3. Beijing University of Posts and Telecommunications, School of Science, Beijing (China)
  • 4. Beijing University of Posts and Telecommunications, State Key Laboratory of Information Photonics and Optical Communication, Beijing (China)

Description

Au/Nb:SrTiO3/Ti structures were fabricated by depositing Au and Ti electrodes on a single crystal 0.5 wt% Nb:SrTiO3 (NSTO) using rf-magnetron sputtering technique. Resistive switching properties at different temperature were investigated. The Ti/NSTO interface was ohmic contact, which indicated that the resistive switching behavior was attributed to Au/NSTO interface. The resistive switching behavior happened only at the temperature above 180 K, which was possibly caused by the increase of Schottky barrier height with the increase of temperature. The structure showed a semiconductor behavior at high-resistance state (HRS) and a metallic behavior at low-resistance state (LRS). The switching conduction mechanism of Au/NSTO/Ti device is primarily described as space-charge-limited conduction (SCLC) according to the electrical transport properties measurement. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-012-7541-y

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
111
Journal Issue
1
Series
Special issue: synchrotron radiation in art and archaeology
Journal Page Range
p. 303-308
ISSN
0947-8396
CODEN
APAMFC