Published April 30, 2005
| Version v1
Journal article
Comparison of the effects of chemical and mechanical pressure in CeCoGe3-x Si x alloys
- 1. Institut fuer Technische Physik, TU Braunschweig, Mendelssohnstrasse, 38106 Braunschweig (Germany)
- 2. Centro Brasileiro de Pesquisas Fisicas, Rio de Janeiro, RJ 22290-180 (Brazil)
Description
The system CeCoGe3-x Si x is of special interest since there is evidence that a quantum critical point of the antiferromagnetic phase can be approached by alloying as well as by application of high pressure. With new results of AC-susceptibility and specific heat measurements on CeCoGe2.1Si0.9 under high pressure presented here, we show by comparison with former data that the tuning parameters composition and pressure, respectively, are equivalent. Alloy and pressure data fit in a common phase diagram. The quantitative behavior of c/T under pressure, too, corresponds to that under changes of composition
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.01.098;
- PII
- S0921-4526(05)00103-1;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 359-361
- Journal Page Range
- p. 278-280
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- International conference on strongly correlated electron systems
- Acronym
- SCES '04
- Dates
- 26-30 Jul 2004
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37065612
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETISM; CERIUM; COBALT; COMPARATIVE EVALUATIONS; GERMANIUM; INTERMETALLIC COMPOUNDS; PHASE DIAGRAMS; PRESSURE DEPENDENCE; SILICON; SPECIFIC HEAT
- Descriptors DEC
- ALLOYS; DIAGRAMS; ELEMENTS; EVALUATION; INFORMATION; MAGNETISM; METALS; PHYSICAL PROPERTIES; RARE EARTHS; SEMIMETALS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.