Published 1979 | Version v1
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Target dependences for continuum capture processes in ion-atom collisions

Description

By using bare and few-electron ions of higher charge on heavier targets, some fundamental aspects of continuum capture which had previously been obscured due to limitations imposed by high direct ionization backgrounds are examined. Beams of 1.6 to 3.9 MeV/u C6+, O8+, and Si14+ were passed through thin targets of helium, neon, and argon. The electrons ejected within a forward cone of half-angle about 1.80 were energy analyzed with data collected using standard multi-scaling techniques. The yields, defined by numerical integration over suitably scaled limits, show several interesting properties which are discussed, notably the velocity dependence. 5 references

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

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Additional details

Additional titles

Augmented title (English)
1.6 to 3.9 MeV/u

Publishing Information

Imprint Pagination
2 p.
Report number
CONF-790861--4

Conference

Title
11. international conference on the physics of electronic and atomic collisions.
Dates
29 Aug - 4 Sep 1979.
Place
Kyoto, Japan.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
11511737
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ARGON; CARBON IONS; CROSS SECTIONS; ELECTRON CAPTURE; EXPERIMENTAL DATA; GRAPHS; HELIUM; ION-ATOM COLLISIONS; KINETICS; MEV RANGE 10-100; MULTICHARGED IONS; NEON; OXYGEN IONS; SILICON IONS; VELOCITY
Descriptors DEC
ATOM COLLISIONS; ATOMIC IONS; CAPTURE; CHARGED PARTICLES; COLLISIONS; DATA; DATA FORMS; ELEMENTS; ENERGY RANGE; INFORMATION; ION COLLISIONS; IONS; MEV RANGE; NONMETALS; NUMERICAL DATA; RARE GASES