Strong cube-textured titanium nitride conductive films directly on flexible metal substrate
- 1. Texas Center for Superconductivity, University of Houston, Houston, TX 77204 (United States)
- 2. Advanced Manufacturing Institute, University of Houston, Houston, TX 77204 (United States)
- 3. Department of Mechanical Engineering, University of Houston, Houston, TX 77204 (United States)
Description
Highlights: • Simple structure of cube-textured conductive TiN by direct deposition on metal foil. • Ion pre-treatment enables cube texture of TiN directly on polycrystalline substrate. • Ion Beam Assisted Deposition for TiN films with in-plane texture spread of only 5.6°. Single crystal-like titanium nitride (TiN) by ion beam assisted deposition (IBAD) method is a potential conductive and thermally-stable template for growing highly-oriented REBa2Cu3O7−x (RE = rare earth) superconductor tapes as well as optoelectronics on flexible metal substrates. Previously, amorphous seed layers such as Al2O3 and Y2O3 were necessary for the biaxially-textured film growth by IBAD. Such nonconductive seed layers prevent an electrically-conductive path between functional film and bottom metal substrate such as flexible, electro-polished Hastelloy (EPH). An approach of Argon ion (Ar+) pre-treatment of EPH surface, followed by roll-to-roll IBAD process has been developed for a simplified architecture of cube-textured TiN directly on flexible metal substrate. Strong cube-textured TiN films with out-of-plane texture spread of 1.8° and in-plane texture spread of 5.6° were obtained by IBAD technique on flexible Hastelloy substrate without any intervening layers; this provides a conductive template for functional layers. Also, the ion pretreatment step is easily achieved in an IBAD system which simplifies the fabrication process.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2021.138848Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2021.138848;
- PII
- S004060902100331X;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 734
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54005274
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ARGON IONS; BUFFERS; DEPOSITION; EPITAXY; FABRICATION; HASTELLOYS; ION BEAMS; LAYERS; MONOCRYSTALS; POLYCRYSTALS; RARE EARTHS; SUBSTRATES; SUPERCONDUCTORS; SURFACES; TIN; TITANIUM; TITANIUM NITRIDES; YTTRIUM OXIDES
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL GROWTH METHODS; CRYSTALS; ELEMENTS; IONS; METALS; NICKEL ALLOYS; NICKEL BASE ALLOYS; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; TITANIUM COMPOUNDS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; YTTRIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.