Asymmetric dislocation/point-defect interactions and the modeling of void swelling
Description
An internally consistent model has been developed for analyzing void swelling during irradiation. The model employs Wigner-Seitz cells around each type of sink, namely dislocation lines, voids, and grain boundaries. Uniform generation of vacancies and interstitials is accounted for, as is diffusion in response to both concentration and radial interaction field gradients. The cells are coupled by equating concentrations and current flows at their peripheries, for arbitrary densities of the various types of sinks. A procedure has been developed for obtaining the best radial interaction fields to replace the actual angularly dependent ones surrounding dislocations. Analytical theoretical support for the chosen value (-1/4 of the average of the square of the actual field) has been developed. Quantitative accuracy has been assessed by comparison with numerical studies employing full angular dependence. The predicted swelling-rate bias factor of approx. 50% is in excellent agreement with available swelling-rate data when one assumes that approx. 16% of the defects initially generated escape close-pair recombination within the cascade. Reasonable theoretical support exists for this survival fraction
Additional details
Publishing Information
- Journal Title
- Am. Soc. Test. Mater., Spec. Tech. Publ.
- Journal Issue
- no.782
- Series
- Am. Soc. Test. Mater., Spec. Tech. Publ.
- ISSN
- 0066-0558
Conference
- Title
- 11. international symposium on effects of radiation on materials, American Society for Testing and Materials.
- Dates
- 28-30 Jun 1982.
- Place
- Scottsdale, AZ (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 15027443
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DISLOCATIONS; MATHEMATICAL MODELS; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; SWELLING; VOIDS
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEFORMATION; LINE DEFECTS; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- CONF-820628--.