Published March 2004
| Version v1
Journal article
Transmission electron microscopy study of metallic multilayers
Creators
Description
Transmission electron microscopy (TEM) becomes a necessary and routine technique in the examination of texture, epitaxy, metastable phases and interface structures in metallic multilayers. This paper presents a viewpoint of study of the structures in both micro and atomic scales by various TEM techniques
Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2003.11.046;
- PII
- S1359646203007784;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 50
- Journal Issue
- 6
- Journal Page Range
- p. 781-786
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38057253
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EPITAXY; INTERFACES; MICROSTRUCTURE; TEXTURE; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CRYSTAL GROWTH METHODS; ELECTRON MICROSCOPY; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.