Published 1986 | Version v1
Report

Prompt charge collection in gallium-arsenide diodes struck by energetic heavy ions

Description

Charge collection was measured as a function of reverse-bias voltage on GaAs Schottky-barrier diodes bombarded with heavy, energetic ions. Ion species included in the study were copper (57 MeV), chlorine (62 MeV), oxygen (18 MeV), and, to establish a baseline for comparisons, 241Am-decay alpha particles (5.4 MeV). Measurements of the drift component of collected charge are compared to funneling predictions based on the Hu and McLean-Oldham models. Results show that significant funneling occurs in these gallium arsenide diodes, in reasonable agreement with predictions for the light ions, but to a lesser extent than predicted by both models for the heavier ions. By comparing these results with data on silicon diodes published in the literature, gallium arsenide is shown to be less responsible to heavy ion strikes than silicon. This enhances the value of the gallium arsenide technology for systems required to operate in environments containing high-energy heavy ions, such as cosmic rays in the exoatmosphere. A corrective plasma screening factor has been added to the McLean-Oldham effective funnel length model to account for the reduced drift collection after heavy-ion strikes

Availability note (English)

University Microfilms Order No. 86-03,278.

Additional details

Publishing Information

Imprint Pagination
139 p.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18029006
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Thesis, Non-conventional Literature
Descriptors DEI
CHARGE COLLECTION; COMPARATIVE EVALUATIONS; GALLIUM ARSENIDES; HEAVY IONS; MEV RANGE 10-100; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DIODES; SILICON DIODES
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; CHARGED PARTICLES; ENERGY RANGE; EVALUATION; GALLIUM COMPOUNDS; IONS; MEV RANGE; RADIATION EFFECTS; SEMICONDUCTOR DEVICES