Published April 2009
| Version v1
Journal article
Measurements of the 82Sr half-life
- 1. National Institute of Standards and Technology, 100 Bureau Dr. Stop 8462, Gaithersburg, MD 20899 (United States)
- 2. Nuclear Energy Institute, 1776 I Street NW, Suite 400, Washington, DC 20006-3708 (United States)
Description
Half-life of 82Sr was measured at the National Institute of Standards and Technology (NIST) using gamma-ray spectrometry and a 4πγ pressurized ionization chamber. The 82Sr half-life was found to be 25.36±0.03 days (k=1) according to gamma-ray spectrometry and 25.34±0.02 days (k=1) according to the 4πγ pressurized ionization chamber measurements
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apradiso.2008.11.017Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2008.11.017;
- PII
- S0969-8043(08)00527-7;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 67
- Journal Issue
- 4
- Journal Page Range
- p. 636-640
- ISSN
- 0969-8043
- CODEN
- ARISEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40049055
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- GAMMA SPECTROSCOPY; HALF-LIFE; IONIZATION CHAMBERS; STRONTIUM 82
- Descriptors DEC
- ALKALINE EARTH ISOTOPES; BETA DECAY RADIOISOTOPES; DAYS LIVING RADIOISOTOPES; ELECTRON CAPTURE RADIOISOTOPES; EVEN-EVEN NUCLEI; INTERMEDIATE MASS NUCLEI; ISOTOPES; MEASURING INSTRUMENTS; NUCLEI; RADIATION DETECTORS; RADIOISOTOPES; SPECTROSCOPY; STRONTIUM ISOTOPES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.