Published April 2011
| Version v1
Journal article
Study of dynamics using x-ray photon correlation spectroscopy
Creators
- 1. Tokyo Univ., Graduate School of Frontier Sciences, Kashiwa, Chiba (Japan)
Description
X-ray Photon Correlation Spectroscopy (XPCS) is a method investigating the dynamics of a system by measuring the fluctuation of scattered intensity. In this article, the principle of XPCS and its application are briefly described. (author)
Additional details
Publishing Information
- Journal Title
- Kobunshi
- Journal Volume
- 60
- Journal Issue
- 4
- Journal Page Range
- p. 178-181
- ISSN
- 0454-1138
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 43013531
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COHERENT RADIATION; CORRELATIONS; FLUCTUATIONS; FREE ELECTRON LASERS; GRAZING INCIDENCE TOMOGRAPHY; LIGHT SCATTERING; MEASURING METHODS; NANOSTRUCTURES; PHOTONS; RUBBERS; SPECTROSCOPY; SPRING-8 STORAGE RING; SYNCHROTRON RADIATION; X RADIATION; X-RAY LASERS
- Descriptors DEC
- BOSONS; BREMSSTRAHLUNG; DIAGNOSTIC TECHNIQUES; ELASTOMERS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; IONIZING RADIATIONS; LASERS; MASSLESS PARTICLES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYMERS; RADIATION SOURCES; RADIATIONS; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; TOMOGRAPHY; VARIATIONS
Optional Information
- Notes
- 40 refs., 4 figs.