Atomically resolved tomographic reconstruction of nanoparticles from single projection: Influence of amorphous carbon support
Creators
- 1. Department of Metallurgical and Materials Engineering, Indian Institute of Technology Madras, Chennai 600036 (India)
- 2. Department of Materials Science and Metallurgic Engineering, and Inorganic Chemistry, Faculty of Sciences, University of Cádiz, Puerto Real, 11510Cádiz (Spain)
- 3. IMEYMAT: Institute of Research on Electron Microscopy and Materials, University of Cádiz, Cádiz (Spain)
Description
Highlights: • Influence of amorphous carbon support on atomic scale tomogram of nanoparticle. • Quantification of carbon support-induced errors using simulated nanoparticles. • Increasing carbon support thickness and/or density increases distortion in tomogram. • Experimental evidence of effect of carbon support on tomograms of Ag nanoparticle. Nanoparticles have a wide range of applications due to their unique geometry and arrangement of atoms. For a precise structure-property correlation, information regarding atomically resolved 3D structures of nanoparticles is utmost beneficial. Though modern aberration-corrected transmission electron microscopes can resolve atoms with the sub-angstrom resolution, an atomic-scale 3D reconstruction of a nanoparticle using Scanning Transmission Electron Microscopy (STEM) based tomographic method faces hurdles due to high electron irradiation damage and "missing-wedge". Instead, inline 3D holography based tomographic reconstructions from single projection registered at low electron doses is more suitable for defining atomic positions at nanostructures. Nanoparticles are generally supported on amorphous carbon film for Transmission Electron Microscopy (TEM) experiments. However, neglecting the influence of carbon film on the tomographic reconstruction of the nanoparticle may lead to ambiguity. To address this issue, the effect of amorphous carbon support was quantitatively studied using simulations and experiments and it was revealed that increasing thickness and/or density of carbon support increases distortion in tomograms.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2020.113177Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2020.113177;
- PII
- S030439912030320X;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 221
- Journal Page Range
- vp.
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112384
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMS; CARBON; COMPUTERIZED SIMULATION; DENSITY; ELECTRONS; GEOMETRY; HOLOGRAPHY; NANOPARTICLES; NANOSTRUCTURES; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; LEPTONS; MATHEMATICS; MICROSCOPY; NONMETALS; PARTICLES; PHYSICAL PROPERTIES; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.