Published August 2005
| Version v1
Journal article
Diode calibration of a Langmuir probe system for measurement of electron energy distribution functions in a plasma
Creators
- 1. UES, Inc., 4401 Dayton-Xenia Road, Dayton, Ohio 45432 (United States)
- 2. Air Force Research Laboratory, Wright-Patterson AFB, Dayton, Ohio 45433 (United States)
Description
It is shown that a simple circuit consisting of a semiconductor diode, a resistor, and a dc voltage source can model a narrow-energy group of electrons in a plasma for the purpose of calibration of a Langmuir probe. The calibration is appropriate when the probe is used for measurement of the electron energy distribution function (EEDF). This simple circuit allows real-time determination of sensitivity, energy resolution, and signal-to-noise ratio for probe measurements of the EEDF
Additional details
Identifiers
- DOI
- 10.1063/1.2006287;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 76
- Journal Issue
- 8
- Journal Page Range
- p. 086105-086105.3
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37035609
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; ELECTRIC POTENTIAL; ELECTRONS; ENERGY RESOLUTION; ENERGY SPECTRA; LANGMUIR PROBE; PLASMA; RESISTORS; SEMICONDUCTOR DIODES; SENSITIVITY; SIGNAL-TO-NOISE RATIO; THERMIONIC DIODES
- Descriptors DEC
- DIMENSIONLESS NUMBERS; DIODE TUBES; ELECTRIC PROBES; ELECTRICAL EQUIPMENT; ELECTRON TUBES; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; LEPTONS; PROBES; RESOLUTION; SEMICONDUCTOR DEVICES; SPECTRA; THERMIONIC TUBES
Optional Information
- Notes
- (c) 2005 American Institute of Physics