Published March 2004
| Version v1
Journal article
Evidence of a stoichiometry-related compensation in undoped high-resistivity CdTe crystals
Creators
- 1. IMEM-CNR, Parco Area delle Scienze 37/A, 43010 Parma (Italy)
Description
Nominally undoped CdTe crystals are grown by both vapour phase and Bridgman technique. The stoichiometry of the feed charge was adjusted in order to obtain n-type, p-type and high resistivity crystals. The stoichiometry of CdTe samples is studied by means of a detailed analysis of the temperature dependence of the equilibrium partial pressures of Cd and Te2 vapours. A strong evidence of a correlation of the stoichiometry and the resistivity of the samples has been found. This suggests that a stoichiometry related defect plays an important role in the compensation mechanism of the nominally undoped crystals. (copyright 2004 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssc.200304277Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. C, Conferences
- Journal Volume
- 1
- Journal Issue
- 4
- Journal Page Range
- p. 739-742
- ISSN
- 1610-1634
Conference
- Title
- 11. International conference o II-VI compounds (II-VI 2003)
- Dates
- 22-26 Sep 2003
- Place
- Niagara Falls, NY (United States)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 35034689
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRIDGMAN METHOD; CADMIUM; CADMIUM TELLURIDES; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; N-TYPE CONDUCTORS; P-TYPE CONDUCTORS; STOICHIOMETRY; TELLURIUM; TEMPERATURE DEPENDENCE; VAPOR PHASE EPITAXY; VAPORS
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELEMENTS; EPITAXY; FLUIDS; GASES; MATERIALS; METALS; PHYSICAL PROPERTIES; SEMICONDUCTOR MATERIALS; SEMIMETALS; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Notes
- With 2 figs., 1 tab., 19 refs.. SICI: 1610-1634(200403)1:4<739::AID-PSSC200304277>3.0.TX;2-K