Published December 15, 2009
| Version v1
Journal article
EDEPR of impurity centers embedded in silicon microcavities
Creators
- 1. Ioffe Physical-Technical Institute, 194021 St.Petersburg (Russian Federation)
- 2. Institut fuer Festkoerperphysik, TU Berlin, D-10623 Berlin (Germany)
Description
We present the first findings of the new electrically-detected EPR (EDEPR) technique which reveal different shallow and deep centers without using the external cavity as well as the hf source and recorder, with measuring the only magnetoresistance of the Si-QW confined by the superconductor δ-barriers.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2009.08.247Additional details
Identifiers
- DOI
- 10.1016/j.physb.2009.08.247;
- arXiv
- arXiv:0910.3851v1;
- PII
- S0921-4526(09)01027-8;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 404
- Journal Issue
- 23-24
- Journal Page Range
- p. 5140-5143
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 25. international conference on defects in semiconductors
- Dates
- 20-24 Jul 2009
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41089755
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAVITIES; ELECTRON SPIN RESONANCE; IMPURITIES; MAGNETORESISTANCE; QUANTUM WELLS; SILICON; SUPERCONDUCTORS
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; MAGNETIC RESONANCE; NANOSTRUCTURES; PHYSICAL PROPERTIES; RESONANCE; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.