Published August 15, 2001 | Version v1
Journal article

Overlap structure of Fano-resonance profiles of excitons in a semiconductor quantum well

  • 1. Institute of Materials Science, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573 (Japan)

Description

The Fano resonance of an exciton in a quantum well of GaASAl0.3Ga0.7As belonging to the Γ7+-irreducible representation is investigated based on the excitonic 4x4 Luttinger Hamiltonian. Multichannel scattering problems for the resonance states are solved by virtue of the adiabatic expansion and the R-matrix propagation method, which enable us to implement high-resolution calculations without introducing any empirical broadening parameters. Absorption spectra for excitons are calculated in 100-500-A-thick quantum wells, and detailed Fano-resonance profiles for both optically active and inactive exciton states are revealed. Specifically, it is noticed that complicated interference between Fano resonances pertaining to different subbands occurs in a quantum well of more than 350 A. A resulting composite profile manifests itself as overlap resonance, accompanying marked changes in a peak height, a width, and an asymmetry pattern from the corresponding isolated profiles. Such changes are evaluated qualitatively by use of Fano's model for one open-channel and two closed-channels. Moreover, quantitative interpretations are also made by employing a time delay given by an eigenphase sum

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
64
Journal Issue
7
Journal Page Range
p. 075318-075318.12
ISSN
1098-0121

Optional Information

Notes
(c) 2001 The American Physical Society