Published November 1, 2017 | Version v1
Journal article

Ellipsometric study of peptide layers – island-like character, depolarization and quasi-absorption

  • 1. ELI-ALPS, ELI-Hu Nkft, Szeged (Hungary)
  • 2. Department of Optics and Quantum Electronics, University of Szeged, Szeged (Hungary)
  • 3. Nanobiology Institute, Yale University, West Haven, CT 06516 (United States)
  • 4. Laboratoire Charles Coulomb (L2C), UMR 5221 CNRS-Université de Montpellier, Montpellier (France)
  • 5. Institute of Biophysics, Biological Research Centre, Hungarian Academy of Sciences, Szeged (Hungary)
  • 6. Department of Oral Biology and Experimental Dental Research, University of Szeged, Szeged (Hungary)

Description

Highlights: • Ellipsometric data of differently adhering peptides on silicon are analyzed. • Transparent, absorbing and discontinuous layer approaches are compared. • Different models provide similar peptide thickness, but optical properties differ. • Strategies are presented which can help to find the appropriate model. • Depolarization can provide useful information about the sample structure. - Abstract: In this work, the ellipsometric measurements of small molecular size polypeptides deposited onto silicon are analyzed. Results of ellipsometric evaluation procedures based on transparent layer, absorbing layer and discontinuous layer approaches are compared. Although these models result in similar fitting quality and can predict the amount of the deposited material, the gained optical properties can be rather different due to the different assumptions of the models. To choose the physically correct results, independent measurements as atomic force microscopy or transmission measurement of peptide solutions are necessary. It is shown that the measured ellipsometric depolarization can provide also useful information about the sample properties.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2017.02.263

Additional details

Identifiers

DOI
10.1016/j.apsusc.2017.02.263;
PII
S0169-4332(17)30649-9;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
421
Journal Issue
Part B
Journal Page Range
p. 707-713
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
7. international conference on spectroscopic ellipsometry
Acronym
ICSE-7
Dates
6-10 Jun 2016
Place
Berlin (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49066185
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; COMPARATIVE EVALUATIONS; DEPOLARIZATION; DEPOSITS; ELLIPSOMETRY; LAYERS; OPTICAL PROPERTIES; POLYPEPTIDES; SILICON; THICKNESS
Descriptors DEC
DIMENSIONS; ELEMENTS; EVALUATION; MATERIALS; MEASURING METHODS; MICROSCOPY; ORGANIC COMPOUNDS; PEPTIDES; PHYSICAL PROPERTIES; PROTEINS; SEMIMETALS; SORPTION

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.