Ellipsometric study of peptide layers – island-like character, depolarization and quasi-absorption
Creators
- 1. ELI-ALPS, ELI-Hu Nkft, Szeged (Hungary)
- 2. Department of Optics and Quantum Electronics, University of Szeged, Szeged (Hungary)
- 3. Nanobiology Institute, Yale University, West Haven, CT 06516 (United States)
- 4. Laboratoire Charles Coulomb (L2C), UMR 5221 CNRS-Université de Montpellier, Montpellier (France)
- 5. Institute of Biophysics, Biological Research Centre, Hungarian Academy of Sciences, Szeged (Hungary)
- 6. Department of Oral Biology and Experimental Dental Research, University of Szeged, Szeged (Hungary)
Description
Highlights: • Ellipsometric data of differently adhering peptides on silicon are analyzed. • Transparent, absorbing and discontinuous layer approaches are compared. • Different models provide similar peptide thickness, but optical properties differ. • Strategies are presented which can help to find the appropriate model. • Depolarization can provide useful information about the sample structure. - Abstract: In this work, the ellipsometric measurements of small molecular size polypeptides deposited onto silicon are analyzed. Results of ellipsometric evaluation procedures based on transparent layer, absorbing layer and discontinuous layer approaches are compared. Although these models result in similar fitting quality and can predict the amount of the deposited material, the gained optical properties can be rather different due to the different assumptions of the models. To choose the physically correct results, independent measurements as atomic force microscopy or transmission measurement of peptide solutions are necessary. It is shown that the measured ellipsometric depolarization can provide also useful information about the sample properties.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2017.02.263Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2017.02.263;
- PII
- S0169-4332(17)30649-9;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 421
- Journal Issue
- Part B
- Journal Page Range
- p. 707-713
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 7. international conference on spectroscopic ellipsometry
- Acronym
- ICSE-7
- Dates
- 6-10 Jun 2016
- Place
- Berlin (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49066185
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; COMPARATIVE EVALUATIONS; DEPOLARIZATION; DEPOSITS; ELLIPSOMETRY; LAYERS; OPTICAL PROPERTIES; POLYPEPTIDES; SILICON; THICKNESS
- Descriptors DEC
- DIMENSIONS; ELEMENTS; EVALUATION; MATERIALS; MEASURING METHODS; MICROSCOPY; ORGANIC COMPOUNDS; PEPTIDES; PHYSICAL PROPERTIES; PROTEINS; SEMIMETALS; SORPTION
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.