Published May 2011
| Version v1
Journal article
New method for calculating the intensities of X rays and thermal neutrons diffracted in single crystals with defects
- 1. National Academy of Sciences of the Republic of Armenia, Institute of Applied Problems of Physics (Armenia)
Description
A new method is proposed to calculate the intensities of X rays and thermal neutrons diffracted in single crystals with defects. This method is based on comparing the dynamic theory of the Bragg diffraction of X rays and thermal neutrons in perfect single crystals with the small-angle scattering theory.
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 56
- Journal Issue
- 3
- Journal Page Range
- p. 405-406
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44014257
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRAGG REFLECTION; CRYSTAL DEFECTS; MONOCRYSTALS; NEUTRON DIFFRACTION; SMALL ANGLE SCATTERING; THERMAL NEUTRONS; X-RAY DIFFRACTION
- Descriptors DEC
- BARYONS; COHERENT SCATTERING; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NEUTRONS; NUCLEONS; REFLECTION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2011 Pleiades Publishing, Ltd.