Published October 20, 2001
| Version v1
Journal article
Characterization of diffraction gratings by use of a tabletop soft-x-ray laser
- 1. Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, Colorado 80523 (United States)
- 2. Grupo de Electromagnetismo Aplicado, Departamento di Fisica, Facultad de Ciencias Exactas, Universidad de Buenos Aires, Ciudad Universitatia, Pabellon 1, 1428 Buenos Aires (Argentina)
- 3. Hyperfine, Incorporated, 4946 North 63rd Street, Boulder, Colorado 80301 (United States)
Description
We have demonstrated the use of a high-repetition-rate 46.9-mm tabletop laser to characterize diffraction gratings designed for grazing-incidence operation in the soft-x-ray spectral region. The efficiencies for various diffraction orders were measured as a function of angle of incidence and compared with the results of model simulations. This measurement technique provides benchmarks with which to improve electromagnetic codes used in the design of soft-x-ray diffraction gratings. The results illustrate the potential of compact tabletop soft-x-ray lasers for use as a new tool for characterization of short-wavelength optics at the manufacturer's site
Additional details
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 40
- Journal Issue
- 30
- Journal Page Range
- p. 5539-5544
- ISSN
- 0003-6935
- CODEN
- APOPAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35054828
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANGULAR CORRELATION; BEAMS; DIFFRACTION GRATINGS; LASERS; MEASURING INSTRUMENTS; OPTICS; SOFT X RADIATION; SYNCHROTRON RADIATION; X RADIATION; X-RAY DIFFRACTION; X-RAY LASERS
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; CORRELATIONS; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; RADIATIONS; SCATTERING; X RADIATION
Optional Information
- Notes
- (c) 2001 Optical Society of America