Structure and mechanical properties of Ti-Al-N coatings deposited by combined cathodic arc middle frequency magnetron sputtering
Creators
- 1. Department of Physics and Development Center for New Materials Engineering and Technology in Universities of Guangdong, Zhanjiang Normal University, Zhanjiang, 524048 (China)
- 2. Accelerator Laboratory, Department of Physics, Wuhan University, Wuhan, 430072 (China)
Description
Research highlights: → Ti-Al-N coatings were deposited on Si and WC substrates by combined cathodic arc middle-frequency magnetron (MF) sputtering under a Ti arc power of 10 kW with different Al MF targets currents. The hardness of the Ti-Al-N coatings was in the range of 23-32 GPa, whereas the Young modulus values were in the range of 420-540 GPa. - Abstract: Ti-Al-N coatings were deposited on Si (1 1 1) and WC substrates by combined cathodic arc middle-frequency magnetron (MF) sputtering under a Ti arc power of 10 kW and with different Al MF targets currents. X-ray diffraction patterns (XRD) showed that the Ti-Al-N coatings were polycrystallize with a preferred (1 1 1) orientation at 2θ = 43.7o. The (1 1 1) diffraction showed a decrease in peak intensity but a increase in FWHM values with the increasing of Al contents. Nano-meter sized TiN crystal grains distinguished by the lattice fringe contrast were verified by plan-view transmission electron (TEM) and selected area electron diffraction (SAED) images. With the increasing of MF sputter currents from 5 to 20 A, the Al contents in the Ti-Al-N coatings monotonically increased from 4.8 to 10.8 at.%, whereas the N and O contents were nearly constant. The hardness of the Ti-Al-N coatings was in the range of 23-32 GPa, and the Young modulus values were in the range of 420-540 GPa.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2010.10.110Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2010.10.110;
- PII
- S0925-8388(10)02639-3;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 509
- Journal Issue
- 5
- Journal Page Range
- p. 1989-1993
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43011361
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COATINGS; CRYSTALS; ELECTRON DIFFRACTION; HARDNESS; MAGNETRONS; MICROSTRUCTURE; SPUTTERING; TITANIUM NITRIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YOUNG MODULUS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; MECHANICAL PROPERTIES; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SCATTERING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.