Published January 15, 2004
| Version v1
Journal article
Atomic layer deposition of thin films of ZnSe--structural and optical characterization
Description
Thin films of sphalerite-type ZnSe were grown by atomic layer deposition (ALD) from elemental Zn and Se precursors. These films, grown on various substrates, show bright blue 'edge' emission accompanied by donor-acceptor pair emissions in the blue, green and red spectral regions. Red, green and blue emissions mixed together give a white color, with a color temperature between 2400 and 4500 K depending on a layer thickness and temperature. ZnSe grown by ALD is in consequence a promising material for the fabrication of semiconductor-based white light emitting thin film electroluminescence displays
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.09.041;
- PII
- S0040609003013130;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 446
- Journal Issue
- 2
- Journal Page Range
- p. 172-177
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013736
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CATHODOLUMINESCENCE; DEPOSITION; ELECTROLUMINESCENCE; LAYERS; SEMICONDUCTOR MATERIALS; SULFIDE MINERALS; TEMPERATURE RANGE 1000-4000 K; TEMPERATURE RANGE OVER 4000 K; THIN FILMS; ZINC SELENIDES
- Descriptors DEC
- CHALCOGENIDES; EMISSION; FILMS; LUMINESCENCE; MATERIALS; MINERALS; PHOTON EMISSION; SELENIDES; SELENIUM COMPOUNDS; TEMPERATURE RANGE; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.