The computer system for the express-analysis of the irradiation samples
Description
The computer system for the express-analysis (SEA) of the irradiation samples is described. The system is working together with the pulse high current electrons and ions source. It allows us to correct irradiation regime in real time. The SEA system automatically measures volt-ampere and volt-farad characteristics, sample resistance by 'four-probe' method, sample capacitor parameters. Its parameters are: in the volt-ampere measuring regime - Umax = 200 V, minimal voltage step Ush =0.05 V, voltage accuracy 0.25%; in the capacity measuring regime - capacity measurement diapason 0 - 1600 pF, working frequencies diapason 1 -150 kHz, capacity accuracy 0.5%, voltage shifting diapason 1 - 200 V, minimal step of voltage shifting Ush 0.05 V. The SEA management is performed by IBM/AT computer. The control and measuring apparatus was realized in CAMAC standard. The programmed set consists of the first display procedures, control, treatment and information exit. (author)
Availability note (English)
Available from INIS in electronic formFiles
31001583.pdf
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Additional details
Additional titles
- Original title (Russian)
- Автоматическая система экспресс-анализа облучаемых образцов
Publishing Information
- Imprint Pagination
- 20 p.
- Report number
- JINR-R--10-99-192
INIS
- Country of Publication
- Joint Institute for Nuclear Research (JINR)
- Country of Input or Organization
- Joint Institute for Nuclear Research (JINR)
- INIS RN
- 31001583
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- ALGORITHMS; CAMAC SYSTEM; COMPUTERIZED CONTROL SYSTEMS; DATA ACQUISITION SYSTEMS; ELECTRIC POTENTIAL; ELECTRICAL PROPERTIES; ELECTRON SOURCES; FLOWSHEETS; ION SOURCES; ON-LINE MEASUREMENT SYSTEMS; PERSONAL COMPUTERS; RADIATION EFFECTS
- Descriptors DEC
- COMPUTERS; CONTROL SYSTEMS; DIAGRAMS; DIGITAL COMPUTERS; INFORMATION; MATHEMATICAL LOGIC; MICROCOMPUTERS; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; PARTICLE SOURCES; PHYSICAL PROPERTIES; RADIATION SOURCES
Optional Information
- Notes
- 7 refs., 13 figs.