Published February 1, 2017 | Version v1
Journal article

Effect of annealing on the sub-bandgap, defects and trapping states of ZnO nanostructures

  • 1. Department of Engineering Physics, Institut Teknologi Sepuluh Nopember (ITS), Jln. Arif Rahman Hakim, Campus ITS Sukolilo, 60111 Surabaya (Indonesia)
  • 2. Institute for Physical Chemistry and Abbe Center of Photonics, Friedrich Schiller University Jena, Helmholtzweg 4, 07743 Jena (Germany)
  • 3. Leibniz Institute of Photonic Technology (IPHT) Jena e. V., Albert-Einstein-Str. 9, 07745 Jena (Germany)
  • 4. Otto Schott Institute of Materials Research, Friedrich Schiller University Jena, Löbdergraben 32, Jena (Germany)
  • 5. Center for Energy and Environmental Chemistry, Friedrich Schiller University Jena, Max-Wien-Platz 9, 07743 Jena (Germany)

Description

Highlights: • Annealing promotes different sub-bandgap, defect and trapping states of ZnO nanostructures. • Annealing reduces the bandgap and extends the band tail. • Annealing suppresses the defects as well as the densities of surface traps reducing recombination loss in DSSC. • The surface traps are more dominating the near conduction band edge of ZnO than the bulk traps. - Abstract: Annealing treatment was applied to different mesoporous ZnO nanostructures prepared by wet chemical synthesis, i.e. nanoflowers (NFs), spherical aggregates (SPs), and nanorods (NRs). The sub-bandgap, defect properties as well as the trapping state characteristics after annealing were characterized spectroscopically, including ultrasensitive photothermal deflection spectroscopy (PDS), photoluminescence and photo-electrochemical methods. The comprehensive experimental analysis reveals that annealing alters both the bandgap and the sub-bandgap. The defect concentration and the density of surface traps in the ZnO nanostructures are suppressed upon annealing as deduced from photoluminescence and open-circuit voltage decay analysis. The photo-electrochemical investigations reveal that the surface traps dominate the near conduction band edge of ZnO and, hence, lead to high recombination rates when used in DSSCs. The density of bulk traps in ZnO SPs is higher than that in ZnO NFs and ZnO NRs and promote lower recombination loss between photoinjected electrons with the electrolyte-oxidized species on the surface. The highest power conversion efficiency of ZnO NFs-, ZnO SPs-, and ZnO NRs-based DSSC obtained in our system is 2.0, 4.5, and 1.8%, respectively.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.chemphys.2016.12.002

Additional details

Identifiers

DOI
10.1016/j.chemphys.2016.12.002;
PII
S0301-0104(16)30945-4;

Publishing Information

Journal Title
Chemical Physics
Journal Volume
483-484
Journal Page Range
p. 112-121
ISSN
0301-0104
CODEN
CMPHC2

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.