Published April 2008 | Version v1
Journal article

A detailed ray-tracing simulation of the high resolution microbeam at the AIFIRA facility

  • 1. Universite Bordeaux 1, CNRS/IN2P3, Centre d'Etudes Nucleaires de Bordeaux-Gradignan, UMR 5797, Chemin du Solarium, BP 120, F-33175 Gradignan cedex (France)

Description

The AIFIRA (Applications Interdisciplinaires des Faisceaux d'Ions en Region Aquitaine) ion beam facility at the CENBG (Centre d'Etudes Nucleaires de Bordeaux-Gradignan) is being equipped with a high demagnification focused microbeam line. This beam line, which is under its final stage of development, should allow focusing of protons and alpha particles down to a sub-micrometer resolution, and is therefore referred to as a 'nanobeam line' in the following paper. We present the complete beam transport simulation along the chosen configuration for the nanobeam line, which consists of a long working distance doublet-triplet of Oxford Microbeam Ltd. OM-50 quadrupoles. These simulations have been performed using the Geant4 Monte Carlo simulation toolkit, which has been previously validated for ray-tracing studies in the design of quadrupole microbeam systems. They include a fine modelling of the quadupole magnetic field, based on the analytical Enge's model, which is compared to a classical square field model and to a high granularity tri-dimensional field map computed with the OPERA3D software. The beam emittance model is parameterized from experimental measurements performed directly on the HVEE Singletron at the AIFIRA facility, allowing the computation of the beam transmitted current along the nanobeam line. Grid shadow images, acquired from simulations, for system alignment purposes and beam deflection studies on target are presented as well

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2007.11.020

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.11.020;
PII
S0168-583X(07)01712-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
8
Journal Page Range
p. 1653-1658
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
18. international conference on ion beam analysis
Dates
23-28 Sep 2007
Place
Hyderabad (India)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40013467
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALIGNMENT; ALPHA PARTICLES; BEAM EMITTANCE; BEAM TRANSPORT; COMPUTER CODES; COMPUTERIZED SIMULATION; CONFIGURATION; DESIGN; ION BEAMS; MAGNETIC FIELDS; MONTE CARLO METHOD; PROTONS; QUADRUPOLES; RESOLUTION; TRIPLETS
Descriptors DEC
BARYONS; BEAMS; CALCULATION METHODS; CHARGED PARTICLES; ELEMENTARY PARTICLES; FERMIONS; HADRONS; IONIZING RADIATIONS; MULTIPLETS; MULTIPOLES; NUCLEONS; RADIATIONS; SIMULATION

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.