Current crowding effects in a CdS/LaS cold cathode
Creators
- 1. Wright Laboratory, Wright--Patterson Air Force Base, Dayton, Ohio 45433 (United States)
- 2. Department of Electrical Engineering, University of Cincinnati, Cincinnati, Ohio 45221 (United States)
Description
We analyze the importance of current crowding in a new cold cathode emitter that consists of a thin wide band-gap semiconductor material sandwiched between a metallic contact and a low work function semimetallic thin film. Potential material candidates are suggested to achieve low-voltage (<10 V), room-temperature cold cathode operation with emission currents of several tens of A/cm2. We calculate the lateral potential drop that occurs across the emission window of cold cathodes with rectangular geometry and describe its effects on the emitted current density profile. The power dissipation in the cold cathode is calculated as a function of a dimensionless parameter characterizing the importance of current crowding. We determine the range of dc bias over which cold cathodes of different width must be operated to minimize current crowding effects. copyright 1997 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 81
- Journal Issue
- 8
- Journal Page Range
- p. 3707-3715.
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28072816
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM COMPOUNDS; CADMIUM SULFIDES; CATHODES; CURRENT DENSITY; ELECTRON EMISSION; LANTHANUM COMPOUNDS; LANTHANUM SULFIDES; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; ELECTRODES; EMISSION; FILMS; RARE EARTH COMPOUNDS; SULFIDES; SULFUR COMPOUNDS