Fault diagnosis for discrete event systems: Modelling and verification
- 1. Laboratoire G-SCOP (Grenoble - Sciences pour la Conception, l'Optimisation et la Production), Grenoble INP, UJF, CNRS UMR5272, 46 avenue Felix Viallet, 38031 Grenoble Cedex 1 (France)
- 2. Honewell HTSL, Brnoe Aerospace (France)
Description
This paper proposes an effective way for diagnosis of discrete-event systems using a timed-automaton. It is based on the model-checking technique, thanks to time analysis of the timed model. The paper proposes a method to construct all the timed models and details the different steps used to obtain the diagnosis path. A dynamic model with temporal transitions is proposed in order to model the system. By 'dynamical model', we mean an extension of timed automata for which the faulty states are identified. The model of the studied system contains the faultless functioning states and all the faulty states. Our method is based on the backward exploitation of the dynamic model, where all possible reverse paths are searched. The reverse path is the connection of the faulty state to the initial state. The diagnosis method is based on the coherence between the faulty occurrence time and the reverse path length. A real-world batch process is used to demonstrate the modelling steps and the proposed backward time analysis method to reach the diagnosis results.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ress.2009.11.007Additional details
Identifiers
- DOI
- 10.1016/j.ress.2009.11.007;
- PII
- S0951-8320(09)00259-2;
Publishing Information
- Journal Title
- Reliability Engineering and System Safety
- Journal Volume
- 95
- Journal Issue
- 4
- Journal Page Range
- p. 369-378
- ISSN
- 0951-8320
- CODEN
- RESSEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41087962
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- DETECTION; DIAGNOSIS; FAULT TREE ANALYSIS; LENGTH; SIMULATION; VERIFICATION
- Descriptors DEC
- DIMENSIONS; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.