Published December 10, 2004 | Version v1
Journal article

Electromagnetically induced transparency in bulk and microcavity semiconductors

  • 1. Scuola Normale Superiore, Piazza dei Cavalieri 7, 56126 Pisa (Italy)
  • 2. Dipartimento di Chimica e Fisica per l'Ingegneria e per i Materiali, Universita di Brescia, Via Valotti 9, 25133 Brescia (Italy)

Description

We discuss our recent results on electromagnetically induced transparency (EIT) effects based on intrinsic free exciton and biexciton states in semiconductors. The Λ configuration obtained from the 1S and 2P yellow exciton levels of Cu2O leads to a well-developed EIT regime, akin to the atomic case. The coherent driving of the exciton-biexciton transition in CuCl induces a tunable transparency window within the polaritonic stop-band, due to the presence of a third polariton branch in the dressed system. In a microcavity configuration, this gives rise to three reflectivity dips in the strong coupling regime

Additional details

Identifiers

DOI
10.1016/j.jlumin.2004.08.005;
PII
S0022-2313(04)00244-3;

Publishing Information

Journal Title
Journal of Luminescence
Journal Volume
110
Journal Issue
4
Journal Page Range
p. 174-180
ISSN
0022-2313
CODEN
JLUMA8

Conference

Title
Excited electronic states and optical properties
Acronym
325. Wilhelm and Else Heraeus workshop on organic molecular solids
Dates
17-19 May 2004
Place
Bad Honnef (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37047727
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CONFIGURATION; COPPER CHLORIDES; EXCITONS; OPACITY; REFLECTIVITY; SEMICONDUCTOR MATERIALS; STRONG-COUPLING MODEL
Descriptors DEC
CHLORIDES; CHLORINE COMPOUNDS; COPPER COMPOUNDS; COPPER HALIDES; HALIDES; HALOGEN COMPOUNDS; MATERIALS; MATHEMATICAL MODELS; OPTICAL PROPERTIES; PARTICLE MODELS; PHYSICAL PROPERTIES; QUASI PARTICLES; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.