Published August 21, 2004 | Version v1
Journal article

Application of ultrasound for the simultaneous improvement intensity and resolution of the Bonse-Hart diffractometer

Description

It is calculated that simultaneous ultrasonic excitation of the Bonse-Hart monochromator and analyzer leads to the improvement of resolution and increasing of the intensity. It is argued that incoherent ultrasonic field is applicable in similar experiments. Ultrasonic phonon satellites were studied by means of Bonse-Hart channel cut crystal. Strong improvement of contrast with moderate loss of intensity was observed in this case. Double Crystal diffractometer with ultrasonically excited monochromator and analyzer was applied for the ultrasonic phonon satellite research. It was observed for the first time that this 'double sound' technique leads to the strong improvement of contrast and simultaneously 60% increasing of the intensity

Additional details

Identifiers

DOI
10.1016/j.nima.2004.04.196;
PII
S0168900204008848;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
529
Journal Issue
1-3
Journal Page Range
p. 152-156
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
International conference on neutron optics; PSND2004: 3. international workshop on position-sensitive neutron detectors
Acronym
NOP2004
Dates
12-16 Jan 2004
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36018928
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; EXCITATION; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; PHONONS; RESOLUTION; SOUND WAVES; USES
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ENERGY-LEVEL TRANSITIONS; MEASURING INSTRUMENTS; QUASI PARTICLES; SCATTERING

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.