Published August 21, 2004
| Version v1
Journal article
Application of ultrasound for the simultaneous improvement intensity and resolution of the Bonse-Hart diffractometer
Creators
Description
It is calculated that simultaneous ultrasonic excitation of the Bonse-Hart monochromator and analyzer leads to the improvement of resolution and increasing of the intensity. It is argued that incoherent ultrasonic field is applicable in similar experiments. Ultrasonic phonon satellites were studied by means of Bonse-Hart channel cut crystal. Strong improvement of contrast with moderate loss of intensity was observed in this case. Double Crystal diffractometer with ultrasonically excited monochromator and analyzer was applied for the ultrasonic phonon satellite research. It was observed for the first time that this 'double sound' technique leads to the strong improvement of contrast and simultaneously 60% increasing of the intensity
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2004.04.196;
- PII
- S0168900204008848;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 529
- Journal Issue
- 1-3
- Journal Page Range
- p. 152-156
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- International conference on neutron optics; PSND2004: 3. international workshop on position-sensitive neutron detectors
- Acronym
- NOP2004
- Dates
- 12-16 Jan 2004
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36018928
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTALS; EXCITATION; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; PHONONS; RESOLUTION; SOUND WAVES; USES
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ENERGY-LEVEL TRANSITIONS; MEASURING INSTRUMENTS; QUASI PARTICLES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.