Radiation defect formation processes in quartz
Creators
Description
Migration processes of electron-alkaly ion pairs (e-, Me+) and e-, H+ from O-Me+ and O-H+-groups of structure defects to three-coordinated Si↑ ions near interstitial iron atoms are shown to proceed under γ-radiation of r-crystals of amethyst in the dose range from 104 to 106 R. These processes create necessary conditions for proceeding the processes of colliding Me+ and H+ ion migration in the dose range from 3x105 to 107 R. Formation (during amethyst irradiation with doses higher 106 R) of considerable concentrations of broken Si-O bindings causes the processes of e-, Me+ pairs migration from the growth defects to these radiation traps. The models of radiation-induced processes suggested explain well kinetics of changing under γ-radiation of main parameters of optical absorption spectra in UV-, visible and IR-regions, acoustic (f=1 MHz) and dielectric (f=1 kHz) losses of artificial amethyst
Additional details
Additional titles
- Subtitle (English)
- 3. Artificial amethyst
- Original title (Russian)
- Процессы радиационного дефектообразования в кварце
- Original subtitle (Russian)
- 3. Iskusstvennyj ametist.
Publishing Information
- Journal Title
- Kristallografiya
- Journal Volume
- 32
- Journal Issue
- 1
- Series
- Kristallografiya.
- Journal Page Range
- 149-156
- ISSN
- 0023-4761
- CODEN
- KRISA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 18094247
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; CRYSTAL DEFECTS; DIELECTRIC PROPERTIES; GAMMA RADIATION; HEATING; OXIDE MINERALS; PHYSICAL RADIATION EFFECTS; QUANTITY RATIO; RADIATION DOSES; SILICON OXIDES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION EFFECTS; RADIATIONS; SILICON COMPOUNDS; SPECTRA
Optional Information
- Notes
- For English translation see the journal Soviet Physics - Crystallography (USA).