Published November 1, 1995
| Version v1
Journal article
A tangent formula derived from Patterson-function arguments. Pt. 3. Structure determination of zeolitic and layered materials from low-resolution powder diffraction data
- 1. Consejo Superior de Investigaciones Cientificas, Madrid (Spain). Inst. de Ciencia de Materials
- 2. Bochum Univ. (Germany). Inst. fuer Mineralogie
Description
The viability of solving the structure type of zeolitic and layered materials applying multisolution direct methods to low-resolution (∼2.2 A) powder diffraction data is shown. The phases are refined with the tangent formula derived from Patterson-function arguments and the correct phase sets are discriminated with the conventional figures of merit. The two test examples presented are (a) the already known tetragonal zeolite ZSM-11 (space group I anti 4m2) at 2.3 A resolution and (b) the hitherto unknown layer silicate RUB-15 (Ibam) at 2.2 A resolution. In both cases, the tetrahedral Si units appear as resolved peaks in the Fourier maps computed with the phases of the highest-ranked direct-methods solutions. (orig.)
Additional details
Publishing Information
- Journal Title
- Acta Crystallographica. Section A: Foundations of Crystallography
- Journal Volume
- 51
- Journal Issue
- 6
- Journal Page Range
- p. 840-845.
- ISSN
- 0108-7673
- CODEN
- ACACEQ
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 27018380
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; DATA ANALYSIS; LATTICE PARAMETERS; LAYERS; SILICON COMPOUNDS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING