Published November 1, 1995 | Version v1
Journal article

A tangent formula derived from Patterson-function arguments. Pt. 3. Structure determination of zeolitic and layered materials from low-resolution powder diffraction data

  • 1. Consejo Superior de Investigaciones Cientificas, Madrid (Spain). Inst. de Ciencia de Materials
  • 2. Bochum Univ. (Germany). Inst. fuer Mineralogie

Description

The viability of solving the structure type of zeolitic and layered materials applying multisolution direct methods to low-resolution (∼2.2 A) powder diffraction data is shown. The phases are refined with the tangent formula derived from Patterson-function arguments and the correct phase sets are discriminated with the conventional figures of merit. The two test examples presented are (a) the already known tetragonal zeolite ZSM-11 (space group I anti 4m2) at 2.3 A resolution and (b) the hitherto unknown layer silicate RUB-15 (Ibam) at 2.2 A resolution. In both cases, the tetrahedral Si units appear as resolved peaks in the Fourier maps computed with the phases of the highest-ranked direct-methods solutions. (orig.)

Additional details

Publishing Information

Journal Title
Acta Crystallographica. Section A: Foundations of Crystallography
Journal Volume
51
Journal Issue
6
Journal Page Range
p. 840-845.
ISSN
0108-7673
CODEN
ACACEQ

INIS

Country of Publication
Denmark
Country of Input or Organization
Denmark
INIS RN
27018380
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CRYSTAL STRUCTURE; DATA ANALYSIS; LATTICE PARAMETERS; LAYERS; SILICON COMPOUNDS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; SCATTERING