Effect of ion irradiation on the thermal stability of thin polymer films
- 1. Faculty of Physics, Pontifical Catholic University of Rio Grande do Sul, Av. Ipiranga 6681, 90619-900 Porto Alegre, RS (Brazil)
- 2. Ion Implantation Laboratory, Institute of Physics, Federal University of Rio Grande do Sul, Av. Bento Gonçalves 9500, 91501-970 Porto Alegre, RS (Brazil)
Description
We report on the stability of poly(methyl methacrylate) thin films in vacuum after exposure to moderate doses of 300 keV H+, 2 MeV H+, and 18 MeV Au7+ ions combined to thermal treatments. A small but steady increase in roughness of the films with increasing fluence was observed for bombardments at room temperature at a rate that varied strongly with dE/dx. For irradiations at 100 °C, the roughness also increased sharply at very low fluences, but it was followed by smoothing and stabilization of the surfaces at larger doses. In situ post-irradiation annealing of samples after a fixed irradiation dose caused evolution on the surface topography that was markedly different for the H+ and Au7+ beams. For samples bombarded with H+ and annealed at 100 °C, the radiation effect was to slow down the roughness increase, stabilizing its value at levels below those of the films not exposed to the beam. Irradiation with 18 MeV Au ions, on the contrary, destabilized the films, causing strong changes in surface morphology and roughness. Such differences in behavior are attributed to the type of damage introduced by each beam and to the synergistic effects of radiation-induced bond breaking and heating
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.05.041Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.05.041;
- PII
- S0168-583X(13)00605-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 314
- Journal Page Range
- p. 71-76
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 8. international symposium on swift heavy ions in matter
- Acronym
- SHIM 2012
- Dates
- 24-27 Oct 2012
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065511
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; GOLD IONS; HYDROGEN IONS 1 PLUS; IRRADIATION; KEV RANGE 100-1000; METHACRYLIC ACID ESTERS; MEV RANGE 01-10; MEV RANGE 10-100; NANOSTRUCTURES; POLYMERS; RADIATION DOSES; ROUGHNESS; STABILITY; SURFACES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS
- Descriptors DEC
- CARBOXYLIC ACID ESTERS; CATIONS; CHARGED PARTICLES; DOSES; ENERGY RANGE; ESTERS; FILMS; HEAT TREATMENTS; HYDROGEN IONS; IONS; KEV RANGE; MEV RANGE; ORGANIC COMPOUNDS; SURFACE PROPERTIES; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.