Effect of annealing temperature on exchange stiffness of CoFeB thin films
Description
We investigate the exchange stiffness constants of 28-nm-thick CoFeB film using Brillouin light scattering. Series of CoFeB films are prepared on the MgO(001) substrate with or without additional 5-nm thick MgO buffer layer, the effect of the annealing temperature on the exchange stiffness constants are studied. We found that the exchange stiffness constant of 400 °C annealed sample with MgO buffer increased by 10% form the 200 °C annealed sample (=0.73±0.01×10−11 J/m), while the exchange stiffness constant of without MgO buffer layer sample increase by 6% from the as-grown sample (=1.11±0.02×10−11 J/m). - Highlights: • We investigate the exchange stiffness constants of CoFeB film using BLS. • The exchange stiffness constant of without MgO buffer layer increase by 6%. • The exchange stiffness constant of annealed sample with MgO increased by 10%. • The exchange stiffness constants are varied with buffer and annealing conditions
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2015.06.073Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2015.06.073;
- arXiv
- arXiv:1506.00129v1;
- PII
- S0304-8853(15)30283-3;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 395
- Journal Page Range
- p. 18-22
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47038885
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; BORON ALLOYS; COBALT ALLOYS; CRYSTAL STRUCTURE; FLEXIBILITY; IRON ALLOYS; LAYERS; LIGHT SCATTERING; MAGNESIUM OXIDES; SPIN WAVES; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALLOYS; CHALCOGENIDES; FILMS; HEAT TREATMENTS; MAGNESIUM COMPOUNDS; MECHANICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TENSILE PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.