Published December 1, 2004 | Version v1
Journal article

Molecular volume and electronic and vibrational polarizibilities for amorphous LaAlO3

  • 1. Air Force Research Laboratory-Space Vehicles Directorate, Kirtland Air Force Base, New Mexico 87117 (United States)
  • 2. Air Force Research Laboratory-Space Vehicles Directorate, Kirtland Air Force Base, New Mexico 87117 and Laboratoire d'Electrostatique et des Materiaux Dielectriques, CNRS, BP 166X, 38042 Grenoble Cedex (France)

Description

Grazing incidence x-ray reflectivity measurements are used to determine the density of sputter-deposited LaAlO3 and anodized LaAl films. Together with refractive index and dielectric constant measurements, it is demonstrated that a coherent picture emerges explaining the low dielectric constant of the amorphous films (∼13) as compared to the single-crystal value (∼26). The importance of molecular volume dependence of the electronic and vibrational molecular polarizabilities is underlined

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
96
Journal Issue
11
Journal Page Range
p. 6642-6647
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2004 American Institute of Physics