Published December 1, 2004
| Version v1
Journal article
Molecular volume and electronic and vibrational polarizibilities for amorphous LaAlO3
Creators
- 1. Air Force Research Laboratory-Space Vehicles Directorate, Kirtland Air Force Base, New Mexico 87117 (United States)
- 2. Air Force Research Laboratory-Space Vehicles Directorate, Kirtland Air Force Base, New Mexico 87117 and Laboratoire d'Electrostatique et des Materiaux Dielectriques, CNRS, BP 166X, 38042 Grenoble Cedex (France)
Description
Grazing incidence x-ray reflectivity measurements are used to determine the density of sputter-deposited LaAlO3 and anodized LaAl films. Together with refractive index and dielectric constant measurements, it is demonstrated that a coherent picture emerges explaining the low dielectric constant of the amorphous films (∼13) as compared to the single-crystal value (∼26). The importance of molecular volume dependence of the electronic and vibrational molecular polarizabilities is underlined
Additional details
Identifiers
- DOI
- 10.1063/1.1808905;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 96
- Journal Issue
- 11
- Journal Page Range
- p. 6642-6647
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36096886
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINATES; AMORPHOUS STATE; DEPOSITION; DIELECTRIC MATERIALS; GRAZING INCIDENCE TOMOGRAPHY; LANTHANUM COMPOUNDS; MONOCRYSTALS; OXIDATION; PERMITTIVITY; POLARIZABILITY; REFLECTIVITY; REFRACTIVE INDEX; THIN FILMS; VIBRATIONAL STATES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHEMICAL REACTIONS; CRYSTALS; DIAGNOSTIC TECHNIQUES; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ENERGY LEVELS; EXCITED STATES; FILMS; MATERIALS; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; SURFACE PROPERTIES; TOMOGRAPHY
Optional Information
- Notes
- (c) 2004 American Institute of Physics