Published February 22, 2006 | Version v1
Journal article Metadata-only

Initial Studies Using a Combined TEM - Scanning Tunnelling Microscopy (STM) Side Entry Sample Holder

Creators

  • 1. Institute for Materials Research, SPEME, University of Leeds, LS2 9JT (United Kingdom)

Description

A combined TEM-STM holder has been evaluated and the STM tip has been used to investigate the mechanical and electrical properties of individual carbon nanotubes with simultaneous observation and analysis in the TEM

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/26/54/jpconf6_26_013.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Identifiers

URL
http://stacks.iop.org/1742-6596/26/54/jpconf6_26_013.pdf;
DOI
10.1088/1742-6596/26/1/013;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
26
Journal Issue
1
Journal Page Range
p. 54-58
ISSN
1742-6596

Conference

Title
Conference on imaging, analysis and fabrication on the nanoscale
Acronym
EMAG-NANO 2005
Dates
31 Aug - 2 Sep 2005
Place
Leeds (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37056051
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CARBON; ELECTRICAL PROPERTIES; NANOTUBES; SAMPLE HOLDERS; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; PHYSICAL PROPERTIES