Published February 2012
| Version v1
Journal article
High-order diffraction gratings for high-power semiconductor lasers
Creators
- 1. Russian Academy of Sciences, Ioffe Physical Technical Institute (Russian Federation)
Description
A deep diffraction grating with a large period (∼2 μm) within one of the cladding layers is proposed for the implementation of selective feedback in a semiconductor laser. Frequency dependences of reflectance in the 12th diffraction order for rectangular, triangular, and trapezoidal diffraction gratings are calculated. It is shown that the maximum reflectance of the waveguide mode is attained using a rectangular or trapezoidal grating ∼2 μm deep in the laser structure. Deep trapezoidal diffraction gratings with large periods are fabricated in the Al0.3Ga0.7As cladding layer of a GaAs/AlGaAs laser structure using photolithography and reactive ion etching.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 46
- Journal Issue
- 2
- Journal Page Range
- p. 241-246
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43129414
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ARSENIDES; CLADDING; DIFFRACTION; DIFFRACTION GRATINGS; FREQUENCY DEPENDENCE; GALLIUM ARSENIDES; GRATINGS; LAYERS; SEMICONDUCTOR LASERS; WAVEGUIDES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; DEPOSITION; GALLIUM COMPOUNDS; LASERS; PNICTIDES; SCATTERING; SEMICONDUCTOR DEVICES; SOLID STATE LASERS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2012 Pleiades Publishing, Ltd.