Published 1973
| Version v1
Book
SEM beam-induced damage in amorphous polymers
Description
no abstract available
Additional details
Publishing Information
- Publisher
- Institute of Physics.
- Imprint Place
- London
- ISBN
- 085498108X
- Imprint Title
- Scanning electron microscopy: systems and applications 1973, proceedings of a conference held at the University of Newcastle upon Tyne, 3-5 July, 1973
- Imprint Pagination
- p. 132-135.
- Journal Issue
- 18
- Series
- Conference series.
Conference
- Title
- systems and applications.
- Acronym
- Conference on scanning electron microscopy
- Dates
- 3 Jul 1973.
- Place
- Newcastle upon Tyne, UK.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 5117006
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; CHEMICAL RADIATION EFFECTS; CROSS-LINKING; DEPOLYMERIZATION; DOSE RATES; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON MICROSCOPY; KEV RANGE 10-100; PERSPEX; POLYCARBONATES; POLYSTYRENE
- Descriptors DEC
- BEAMS; CARBON COMPOUNDS; CARBONATES; CHEMICAL REACTIONS; DECOMPOSITION; ENERGY RANGE; ESTERS; KEV RANGE; LEPTON BEAMS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; PARTICLE BEAMS; POLYACRYLATES; POLYMERIZATION; POLYMERS; POLYOLEFINS; POLYVINYLS; RADIATION EFFECTS