X-ray diagnostic calibration with the tabletop laser facility EQUINOX
Creators
- 1. CEA-DIF, Bruyeres-le-Chatel, 91297 Arpajon (France)
Description
The broadband x-ray emission of a target irradiated by a laser can be used to check the calibration of detectors. At CEA-DIF we have a tabletop picosecond laser facility called EQUINOX with 0.3 J at 800 nm. The laser is focused inside a target chamber onto a solid target and produces bright radiation in the 100-2000 eV spectral range. The x-ray source is routinely monitored with a pinhole camera for source dimension measurement and with x-ray diodes for flux measurement. In addition an x-ray transmission grating spectrometer, a crystal spectrometer, and a single count charge coupled device camera measure the x-ray spectrum between 100 eV and 15 keV. The absolute calibration of those sets of spectrometers allows us to fully characterize x-ray emission spectra. Typical duration is less than 100 ps. The spectrum can be tuned by changing target material, pulse length, and x-ray filters. An application to checking the calibration of x-ray diodes used in the broad band spectrometer DMX with single shots will be presented.
Additional details
Identifiers
- DOI
- 10.1063/1.2965212;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 79
- Journal Issue
- 10
- Journal Page Range
- p. 10E932-10E932.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 17. topical conference on high-temperature plasma diagnostics
- Acronym
- HTPD08
- Dates
- 11-15 May 2008
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41016082
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; CAMERAS; CHARGE-COUPLED DEVICES; EMISSION SPECTRA; EV RANGE; LASERS; TARGET CHAMBERS; X RADIATION; X-RAY DETECTION; X-RAY SOURCES; X-RAY SPECTRA; X-RAY SPECTROMETERS
- Descriptors DEC
- ACCELERATOR FACILITIES; DETECTION; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DEVICES; SPECTRA; SPECTROMETERS
Optional Information
- Notes
- (c) 2008 American Institute of Physics